Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords
Förster effect
bipolar transistor
charge qubit
dissociation
etching
fluorocarbon gases
gas temperature
ionization
kinetics
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
specific power
Current Issue
Vol 53, No 6 (2024)
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Keywords
Förster effect
bipolar transistor
charge qubit
dissociation
etching
fluorocarbon gases
gas temperature
ionization
kinetics
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
specific power
Current Issue
Vol 53, No 6 (2024)
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Author Details
Author Details
Lukichev, V. F.
Issue
Section
Title
File
Vol 53, No 1 (2024)
МОДЕЛИРОВАНИЕ
Modeling of Physical-Chemical and Electronic Properties of Lithium-Containing 4H—SiC and Binary Phases of the Si—C–Li System
Vol 53, No 1 (2024)
МОДЕЛИРОВАНИЕ
Modeling of the Electronic Properties of M-Doped Supercells (М = Zr, Nb) with a Monoclinic Structure For Lithium-Ion Batteries
Vol 52, No 4 (2023)
КВАНТОВЫЕ ТЕХНОЛОГИИ
Tomography of Detectors Taking Dead Time into Account
Vol 52, No 3 (2023)
КВАНТОВЫЕ ТЕХНОЛОГИИ
Precise Tomography of Qudits
Vol 52, No 3 (2023)
МОДЕЛИРОВАНИЕ
Simulation of the Adsorption and Diffusion of Lithium Atoms on Defective Graphene for a Li-Ion Battery
Vol 52, No 1 (2023)
МОДЕЛИРОВАНИЕ ТЕХНОЛОГИЧЕСКИХ ПРОЦЕССОВ
Simulation of Supercell Defect Structure and Transfer Phenomena in TlInTe2
Vol 53, No 6 (2024)
МОДЕЛИРОВАНИЕ
Modeling of Structural Properties and Transport Phenomena in Doped Multicomponent 2D Semiconductors
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