电邮这篇文章 Electron beam stimulated luminescence of helium ion irradiated hexagonal boron nitride
- 作者: Petrov Y.V.1, Vyvenko O.F.1, Gogina O.A.1, Sharov T.V.1, Kovalchuk S.2, Bolotin K.2
-
隶属关系:
- Saint-Petersburg State University, Faculty of Physics
- Freie Universität Berlin, Department of Physics
- 期: 卷 87, 编号 10 (2023)
- 页面: 1423-1429
- 栏目: Articles
- URL: https://kld-journal.fedlab.ru/0367-6765/article/view/654582
- DOI: https://doi.org/10.31857/S0367676523702484
- EDN: https://elibrary.ru/PIVYRE
- ID: 654582
如何引用文章
开放存取
##reader.subscriptionAccessGranted##
订阅存取
详细
The impact of the irradiation with focused helium ion beam and electron beam on the cathodoluminescence (CL) of hexagonal boron nitride was investigated. It was shown that the irradiation with helium ions resulted in a decrease of the intensity of CL in the region 200–700 nm. Subsequent irradiation with electrons results in an increase of the intensity of 2 eV CL band comparing with its intensity in pristine material.
作者简介
Yu. Petrov
Saint-Petersburg State University, Faculty of Physics
Email: o_gogina@mail.ru
Russia, 199034, Saint-Petersburg
O. Vyvenko
Saint-Petersburg State University, Faculty of Physics
Email: o_gogina@mail.ru
Russia, 199034, Saint-Petersburg
O. Gogina
Saint-Petersburg State University, Faculty of Physics
编辑信件的主要联系方式.
Email: o_gogina@mail.ru
Russia, 199034, Saint-Petersburg
T. Sharov
Saint-Petersburg State University, Faculty of Physics
Email: o_gogina@mail.ru
Russia, 199034, Saint-Petersburg
S. Kovalchuk
Freie Universität Berlin, Department of Physics
Email: o_gogina@mail.ru
Germany, 14195, Berlin
K. Bolotin
Freie Universität Berlin, Department of Physics
Email: o_gogina@mail.ru
Germany, 14195, Berlin
参考
- Bourrellier R., Meuret S., Tararan A. et al. // Nano Lett. 2016. V. 16. No. 7. P. 4317.
- Castelletto S., Inam F.A., Sato S., Boretti A. // Beilstein J. Nanotechnol. 2020. V. 1. No. 1. P. 740.
- Korona T., Chojecki M. // Int. J. Quant. Chem. 2019. V. 119. No. 14. Art. No. e25925.
- Weston L., Wickramaratne D., Mackoit M. et al. // Phys. Rev. B. 2018. V. 97. No. 21. Art. No. 214104.
- Turiansky M.E., Alkauskas A., Bassett L.C. et al. // Phys. Rev. Lett. 2019. V. 123. No. 12. Art. No. 127401.
- Tran T.T., Kerem Bray, Ford M.J. et al. // Nature Nano-technol. 2016. V. 11. No. 1. P. 37.
- Grosso G., Moon H., Lienhard B. et al. // Nature Commun. 2017. V. 8. No. 1. P. 1.
- Choi S., Tran T.T., Elbadawi C. et al. // ACS Appl. Mater. Interfaces. 2016. V. 8. No. 43. P. 29642.
- Guo N.J., Liu W., Li Z.P. et al. // ACS Omega. 2022. V. 7. No. 2. P. 1733.
- Петров Ю.В., Гогина О.А., Вывенко О.Ф. и др. // ЖТФ. 2022. Т. 92. № 8. С. 1166.
- Ziegler J.F., Ziegler M.D., Biersack J.P. // Nucl. Instrum. Meth. Phys. Res. B. 2010. V. 268. No. 11–12. P. 1818.
- Drouin D., Couture A.R., Joly D. et al. // J. Scan. Microsc. 2007. V. 29. No. 3. P. 92.
- Uddin M.R., Majety S., Li J. et al. // J. Appl. Phys. 2014. V. 115. No. 9. Art. No. 093509.
- Pons D., Bourgoin J.C. // J. Physics C. 1985. V. 18. No. 20. P. 3839.
- Hoffman D.M., Doll G.L., Eklund P.C. // Phys. Rev. B. 1984. V. 30. No. 10. P. 6051.
- Ngwenya T.B., Ukpong A.M., Chetty N. // Phys. Rev. B. 2011. V. 84. No. 24. Art. No. 245425.
补充文件
