APPROXIMATION AND SMOOTHING OF A FUNCTION BASED ON GODUNOV REGULARIZATION

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Abstract

The behavior of the ferromagnetic resonance spectra of thin magnetic films made of permalloy Fe30Ni70 with a thickness of 50 nm was studied depending on the conductivity of a 0.25 mm thick silicon substrate. The films were obtained by vacuum magnetron sputtering using a DC magnetron. The spectra were taken on a scanning ferromagnetic resonance spectrometer at a frequency of 3.123 GHz with a measurement locality of ~ 1.0 mm2, determined by the area of the hole in the measuring head. It was found that in a certain range of substrate conductivity, the spectra taken when the sample was positioned with the film facing the measuring hole are inverted when the free side of the substrate faces the measuring hole. The results of the electrodynamic analysis of the one-dimensional model, reflecting the conditions of the experiment, are in qualitative agreement with the measurement results.

About the authors

B. A Belyaev

Reshetnev Siberian State University of Science and Technology; Siberian Federal University

Email: belyaev@iph.krasn.ru
Krasnoyarsk, Russia

V. V Tyurnev

Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences

Krasnoyarsk, Russia

G. V Skomorokhov

Siberian Federal University; Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences

Krasnoyarsk, Russia

A. A Gorchakovsky

Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences

Krasnoyarsk, Russia

I. V Podshivalov

Siberian Federal University; Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences

Krasnoyarsk, Russia

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